A latch (17) is provided to retain a terminal (18) relative to the test probe (2).

A probe card includes a first micro probe head (MPH), a second MPH, and needles.

The microprocessor (22) also has a further test probe (20) for connection to the various terminals in the wiring harness (10).

Apparatus for testing the mechanical integrity of a terminal by urging a terminal (18) and test probe (2) together to subject a terminal (18) to a force.

A testing machine is disclosed as having the covered probe card therein.

A latch (17) is provided to retain a terminal (18) relative to the test probe (2).

A test signal is sent through the verification wafer (501) to the probe card (156).

The probe card (156) is brought in contact with a contact region (503) on the verification wafer (501).

A probe message based on the computer system's response to the exploit probe is generated.

The present invention provides methods, apparatuses and computer programs for verifying the integrity of a probe by comparing the signal value of a probe to a threshold value.

Vision Inspection: Lead Integrity - Pin-One Orientation - Mark Verification

The wireless link can allow for verification of the probe card assembly while it is installed within a prober.

A probe card includes a first micro probe head (MPH), a second MPH, and needles.

The microprocessor (22) also has a further test probe (20) for connection to the various terminals in the wiring harness (10).

A method of testing a probe card (156) includes the step of positioning the probe card (156) in a prober (152) over a verification wafer (501) that is placed on a stage (159).