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bâtiment et travaux publics - iate.europa.eu
High quality test generation targeting power supply noise...38.7% compared with the best random fill....
général - core.ac.uk - PDF: oaktrust.library.tamu.edu
A novel framework for functionally untestable transition fault avoidance during atpg... However, due to the random fill of don’tcare bits in test patterns, incidental detection of functionally untestable faults becomes possible....


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