An X-ray detection element (15) detects X-rays generated by the X-ray tube (13).

An X-ray tube (13) generates X-rays.

The X-ray line sensor (14) receives X-rays from the X-ray irradiator (13).

The X-ray irradiator (13) irradiates the connected-multibag article (M) with X-rays.

An X-ray examination apparatus comprises an X-ray source (2), an X-ray detector (3) and an X-ray filter (4) arranged between the X-ray source (2) and the X-ray detector (3).

An X-ray generator comprises an X-ray monitor for monitoring X rays generated from a target.

  An X-ray image acquisition system (1) applies X rays to a subject (S) from an X-ray source and detects X rays in multiple energy ranges transmitted through the subject (S).

The Si substrate (3) detects soft X rays and the CdTe substrate (4) detects hard X rays.

The X-ray tube emits X-rays at a subject.

The X-ray detection unit detects transmitted X-rays, which are X-rays that have been transmitted through the target product.

The X-ray detector detects X-rays transmitted through the subject and outputs projection data.

　The x-ray device irradiates x-rays on an object and detects x-rays that pass through the object.

The x-ray emission section emits x-rays to a subject.

The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube.

An X-ray tube having a structure suitable for irradiating X-rays over a wide range, and an X-ray irradiator employing it.

The support means has an X-ray path through which the X-rays generated by the X-ray generator passes without interference.

An X-ray bulb (13) emits X-rays onto the object (50) pulsationally.

The systems may operate by irradiating the materials with x-rays (712) and then detecting fluoresced x-rays, transmitted x-rays, or both.

Wherein, the x ray source (S), the source grating (G0), the fixed grating module (P) and the x ray detector (T) are in sequence arranged in the x ray propagating direction.

The soft X ray outgoing axis direction of the soft X ray tube (3) crosses the above predetermined axis direction.

An x ray imaging system comprises: an x ray source (S), a source grating (G0), a fixed grating module (P), an x ray detector (T) and a computer workstation.

In the fluorescent X-ray analytical method, scattering or diffraction X ray change can be suppressed by regulating the crystal structure of the crystal part and the incidence azimuth of the incident X ray.

The said computer workstation controls the x ray source (S), the source grating (G0) and the x ray detector (T).