In this case, a target material situated in the beam path of the primary beam is exerted by the primary beam to emit secondary radiation.

The intensity of said secondary radiation is measured by a detector arranged outside the beam path of the primary beam.

The semiconductor chip (110) is designed for emitting primary radiation (170).

The primary radiation is partly scattered in the object owing to interactions with the object.

The variation in the modified primary radiation is observed when there are variations in the extension.

The apparatus may comprise a detector (8) for detection of secondary radiation (11) backscattered from the sample and induced by the primary beam.

The computer tomograph comprises a radiation source for radiating primary radiation through an object which is present in an examination region.

Fluorescence radiation (VF) is excited by primary radiation (VE) in the sample (20) and imaged by a microscope.

Said material is arranged in the beam path of the radiation-emitting functional layer and at least partially converts the primary radiation into a radiation having a longer wavelength.

The proportion of ultraviolet radiation, in reference to a total optical output of the primary radiation, is between 0.1% and 4.0% inclusive.

Particles (10, 11) that interact with the primary radiation (6) are introduced into the medium (7).

The primary radiation emitted by the antenna arrangement almost completely lightens a microwave diffuser (19).

In addition, by limiting a readout time of a detector, primary radiation component may be read because of a delay in the scattered radiation.

A radiographic imaging apparatus (10) comprises a primary radiation source (14) which projects a beam of radiation into an examination region (16).

In both variants, at least one additional radiation detector per radiant flux-forming block can be installed on the filter, said detector being used to register the primary radiation of the source.