The test pattern (322) is then hidden and a second test pattern is displayed at a different location than the location at which the first test pattern (322) was presented.
Alternatively, the individual then compares the briefly presented pattern.
A test pattern (322) is presented to an individual.
The test pattern (120) has at least one test corner (110) for evaluating a degree of corner rounding when the test pattern is defined in the photomask (106).
Therefore, in the present invention, a test pattern having a long period and a test pattern having a short period are recorded, and the density of the test patterns is read by a sensor.
The individual then compares the second test pattern, as perceived by him, with a predefined reference pattern.
Conventional techniques that automatically read a test pattern are also known, but the precision thereof is poor because the test pattern is recorded without taking into account the state of a head.
A patch-like pattern is used as a test pattern for adjusting the positions of first and second dots formed at different timings.
There is disclosed apparatus and methods of generating a test pattern of data, analysing a test pattern of data, and testing a data storage disk medium and/or a read/write head.
These steps are then repeated several times while changing the location of presentation of the test pattern.
A test pattern is moved on a screen 5 subject to measurement with the field of view of an image sensor pursuing the motion of the test pattern so as to observe BEW.
In addition, the photomask further has a test pattern (120) and a crosshair orientation mark (102) defined therein.
A test pattern consisting of circular patterns (50) and a background (60) is displayed on a monitor (100) to be measured by a pattern display means (230).
The test images occupy locations within the test pattern indicated by location coordinates (36, 38).
During a test procedure, a PAM4 transmitter is configured to repetitively transmit a PAM4 symbol test pattern, which is captured as a signal waveform.
Requêtes fréquentes français :1-200, -1k, -2k, -3k, -4k, -5k, -7k, -10k, -20k, -40k, -100k, -200k, -500k, -1000k,
Requêtes fréquentes anglais :1-200, -1k, -2k, -3k, -4k, -5k, -7k, -10k, -20k, -40k, -100k, -200k, -500k, -1000k,
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