Other surfaces of the film in the overlap-splice section are formed evenly between the overlap-splice section and sections other than the overlap-splice section.

As a result, a tire is provided which inhibits the formation of cracks in the vicinity of the overlap-splice section of the inner liner layer, and which exhibits excellent durability.

Other surfaces of the film in the overlap-splice section are formed evenly between the overlap-splice section and sections other than the overlap-splice section.

The invention relates to a method and a device for the measuring of the overlap width of a lap joint where two work pieces (b1, b2) lie flat upon each other.

A plurality of bars (12 to 22) are joined together in the joining device (10) by a bolted cover-disk connection system (34, 36, 40).

The joined body exhibits high joint strength.

The junction of the base and capping layer within each mesa forms a photodiode.

The junction and barrier layers in the junction are formed by atomic layer-by-layer deposition.

A single quantum well II-VI laser diode without semiconductor cladding layers includes a pn junction formed by overlaying light-guiding layers (14, 16) of p-type and n-type ZnSe on an n-type GaAs substrate.

Silicon carbide bipolar junction transistors having an overgrown base layer (18) are provided.

collection by means of assessment books

The overlapping zone comprises a continuous resistance weld (16).

joining by gripping with special tapes

A soft recovery diode is made by first implanting helium into the die (10) to a location below the P/N junction and the implant annealed.

If necessary, a cover layer is then applied to the inner surface of the joint.