Imbalance-based self-test for high-speed mixed-signal embedded systems... This brief proposes a novel test methodology to accurately predict individual DUT specifications by overcoming the imbalance problem with the imbalance generator, a radio-frequency transformer, and a programmable capacitor array based on a loopback test configuration....
An improved rf loopback for test time reductionIn this work a method to improve the loopback test used in RF analog circuits is described....
Dynamic performance characterization of embedded single-ended mixed-signal circuitsThe inherent fault-masking characteristic of the traditional loopback test produces overly pessimistic estimates of device-under-test (DUT) performance, which negatively impacts product yield, although the loopback test provides a promising...
Spectral prediction for specification-based loopback test of embedded mixed-signal circuitsAbstract — Loopback testing of Mixed-signal SOCs provides a low-cost test solution, but suffers from fault masking, resulting in serious yield loss and low test accuracy....
