Comparing current flows in ultrashallow pn-/schottky-like diodes with 2-diode test method... Differential diode current characteristics and collector currents obtained from lateral transistor operation of the same 2-diode test structure are used to reliably identify the diode type and variations in metal-Si interfacial properties, independent of parasitic leakage currents....
Realization of efficient metal grating couplers for membrane-based integrated photonics... In contrast to dielectric gratings, simulations predict strongly reduced parasitic leakage of light to the substrate and are performance independent of the optical buffer thickness, while using standard fabrication processes with high yield....
Characterization and modeling of silicon cmos transistor operation at low temperature... the hot carrier effects or the parasitic leakage current are physically discussed....
Application note: spartan-3 families eliminating i/o coupling effects when interfacing large-swing single-ended signals to user i/o pins on spartan-3 families... In one solution (and in the general case of severe positive and/or negative overshoot), parasitic leakage current between User I/O in differential pin pairs might occur, even though the User I/O pins are configured with single-ended I/O standards....
