Characteristics of test signal to be generated

Characteristics of test signal to be generated

The analysis of the reflected test signal is based on determining a signal level of the reflected test signal.

The test signal generator can provide a test signal to a signal path of the telecommunication system.

The recovered test signal is then objectively analyzed to determine a measure of perceptual quality by comparing the recovered test signal to a pre-stored representation of the test signal.

The power level of the received test signal is compared to the power level of the transmitted test signal.

The power level of the received test signal is then compared to the power level of the transmitted test signal.

The method of testing the transducer includes coupling the test signal to the transducer, disabling the amplifier, and measuring the response of the transducer to the test signal with the test processing circuit.

A driver circuit is capable of providing a version of the DC test signal and a version of the AC test signal to the semiconductor device.

An output for the loop qualification test device is based on the measured test signal.

The processed test signal is then received by an equipment under test, which further processes the processed test signal to recover a representation of the test signal.

The interaction of the incident test signal with the test sample produces a modulated test signal, at least a portion of which the probe head is configured to recover.

The test signal unit (48) may be arranged to generate the test signal (56) in dependence on the operating signal (60).

An actual response signal of the physical test rig (10) and the test specimen (18) to the test drive signal is obtained and an error as a function of the actual response signal and a selected response signal is calculated.

Generation of the second test signal may be limited to occur when the first test signal indicates a fault.