An on-line scanning sensor system (fig. 1) includes a mid-infrared spectrophotometric analyzer (fig. 2), such as an interferometer, that can be used on-line in manufacturing environments.
An automatic visual inspection apparatus has two linescan cameras (2 and 3).
The apparatus further includes at least one line scan sensor for detecting and measuring the interference beam.
The Time Delay Integration line-scan camera is positioned in a general area of the image formation plane.
Requêtes fréquentes français :1-200, -1k, -2k, -3k, -4k, -5k, -7k, -10k, -20k, -40k, -100k, -200k, -500k, -1000k,
Requêtes fréquentes anglais :1-200, -1k, -2k, -3k, -4k, -5k, -7k, -10k, -20k, -40k, -100k, -200k, -500k, -1000k,
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