Through the shift register system (230), each driver (220, 221, 222) is controlled by at least one 1-bit boundary scan cell implementing a boundary scan function.
In an embodiment, the shift register system (230) refers to a boundary scan test interface.
The invention also provides for a hybrid solution to adapt boundary scan compatible COTS component so that they can be used within a chainless boundary scan architecture.
A boundary scan register can be coupled between the level shifter output and the first integrated circuit portion.
Consequently, a die of a partially assembled multi-die device such as a System-in-Package may be tested using its integrated boundary scan test architecture.
The housing includes a boundary-scan port through which updated instructions are communicated and power provided.
In this way, the same type of semiconductor circuit chips for which the boundary controller (80) is provided can be stacked, thereby manufacturing the semiconductor device.
Requêtes fréquentes français :1-200, -1k, -2k, -3k, -4k, -5k, -7k, -10k, -20k, -40k, -100k, -200k, -500k, -1000k,
Requêtes fréquentes anglais :1-200, -1k, -2k, -3k, -4k, -5k, -7k, -10k, -20k, -40k, -100k, -200k, -500k, -1000k,
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