Disclosed is a compound microscope device (1) which is provided with a transmissive electron microscope (2), and an optical microscope (4).

A transmission electron microscope has a target body position on the electron optical axis of the microscope, and an electrically conductive body off the axis of the microscope.

An electron microscope (11) is provided.

The system (10) includes a scanning electron microscope (18) and a processing unit (14) connected to the scanning electron microscope (18).

Disclosed is a scanning electron microscope (SEM).

A scanning electron microscope, a focused ion-beam microscope (10), or a microscope having both beams (120, 130), also has an optical microscope (140).

A means or artefact for calibrating the height/depth or Z axis of a microscope, such as a confocal microscope, an interference microscope or a Scanning Electron Microscope.

A method is described of viewing a single tissue sample with a light microscope and an electron microscope.

The invention can be used for a transmission electron microscope.

Provided is a sample holder (1) for an electron microscope, which enables observation, using an electron microscope, of the electrochemical behavior of ions (atoms).

Vibrations of the specimen in a SEM may lead to a serious reduction of the resolution that can be achieved by means of the SEM.