The sample mount can be subsequently analysed by X-ray computerised tomography, scanning electron microscopy (SEM) and combined SEM and focused ion beam (FIB).

Scanning electron microscopy at the CMTC (75 students this year)

ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM).

The LYRA3 FEG is a favorable combination of SEM and FIB for demanding users.

Consequently, without taking out the foreign material observed in the SEM from the vacuum chamber of the SEM, the minute organic foreign material can be analyzed by mass spectrometry.

The SEM includes a backscatter electron detector disposed adjacent to specimen holder.

The more sophisticated SEM was used for Rob Will’s gloves, and both the AA and the SEM were used on his hands.

forensic science because the SEM part, the microscopy, allows

A method and apparatus for generating an image of a specimen with a scanning electron microscope (SEM) is disclosed.

In other embodiments, the sample may be a light microscope (LM) specimen or a scanning electron microscope (SEM) specimen.

The extracting the outline of the actual mask pattern may include, for example, imaging the actual mask (107) using a scanning electron microscope (SEM) (105).

The term "SEMD10" "SEMD50" and "SEMD90" refer respectively to D10, D50 and D90 as determined by image analysis with a scanning electron microscope (SEM).

Thin tissue sections or ribbons may be particularly processed/prepared to facilitate imaging with a scanning electron microscope (SEM).