The first obtained metrology data is not one of the metrology data in the set of metrology data earlier obtained.
The radial and azimuthal differential metrology profiles are applied to adjust a reference metrology profile to provide a virtual metrology of the process chamber.
A metrology system that has one or more central 'metrology servers' and one or more 'metrology slaves' (70).
These are Scientific Metrology, Industrial Metrology and Legal Metrology.
Metrology is divided into three major fields: legal metrology, scientific metrology and industrial metrology.
The International Bureau of Weights and Measures (BIPM) and the International Organization of Legal Metrology (OIML) coordinate the international network of national metrology institutes and national legal metrology authorities.
Tag: “26th General Conference of Weights and Measures
Each year World Metrology Day is organised and celebrated jointly by the International Bureau of Weights and Measures and the International Organisation of Legal Metrology.
The invention can be used in measuring technology.
A metrology algorithm may be applied to the characteristics to determine a predicted accuracy and precision of measurements of the metrology target made by the metrology system.
The feature (38) provided for measurement by a step height metrology tool and a phase metrology tool to calibrate the step height and phase metrology tools.
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The invention also relates to metrology devices and associated methods.
metrology of final radionucleide decay
Parameters of the RF metrology system are determined prior to placing the RF metrology system in the field.
Federal Institute of Metrology
Application: in robotics and metrology.
A significant factor metrologists must understand is the concept of metrological traceability.
The usefulness metric is separate from the enhancement algorithm such that a variety of different enhancement algorithms can be used in conjunction with the metric.
An automatically adjustable method for use in opto-acoustic metrology or other types of metrology operations is described.
The National Metrology Laboratory (LNE: scientific and industrial division),
Illumination subsystems of a metrology or inspection system, metrology systems, inspection systems, and methods for illuminating a specimen for metrology measurements or for inspection are provided.
The invention is applicable to fiber-optic metrology.
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