An apparatus (10) for measuring emission time delay during irradiation of a sample (32).

In another aspect of the invention, a pattern on a target sample formed by the above methods is disclosed.

According to the analysis method, a second LC/MS/MS analysis is executed for the same target sample.

An LED point imaging scanner for stimulating and reading fluorescent and reflective signal radiation from a target sample (10) is disclosed.

Then, each case in the target sample is paired with the most similar case from the online opt-in sample.

By using an imaging device (30), it is possible to determine the concentration of fluorescent pigments contained in a target sample (1).

An electric field is applied in the region of a sample target (5) to accumulate ions generated from a local ion source (24) on a solid or liquid phase sample (4) prior to applying a laser desorption pulse (40).

Also provided are methods of using the subject LIBS devices to determine whether one or more elements of interest are present in a target sample.

This system may be part of an optical analysis system that detects kinetic events and allows for variable magnification of a discrete target sample.